DocumentCode

1915214

Title

Investigation of Transient Effects in SOI MOSFETs at High Temperature

Author

Augendre, E. ; Pelloie, J.-L. ; Cristoloveanu, S. ; Borel, G.

Author_Institution

LETI-CEA/Grenoble, France

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

436

Lastpage

439

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

conf

Filename

1503582