Title :
Investigation of Transient Effects in SOI MOSFETs at High Temperature
Author :
Augendre, E. ; Pelloie, J.-L. ; Cristoloveanu, S. ; Borel, G.
Author_Institution :
LETI-CEA/Grenoble, France
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
