DocumentCode
1915245
Title
A model for impulsive EMI effects caused by low voltage ESD
Author
Honda, Masamitsu
Author_Institution
Nihon Unisys. Ltd., Yokohama, Japan
fYear
1993
fDate
2-8 Oct 1993
Firstpage
1839
Abstract
A model for impulsive electromagnetic interference (EMI) effects caused by relatively low-voltage electrostatic discharge (ESD) on digital electronic systems is proposed. The power of impulsive EMI is governed by the product of the following three parameters: charged voltage, rise time of the discharge current, and susceptibility of the system
Keywords
electromagnetic interference; electrostatic discharge; ESD; LV; charged voltage; digital electronic systems; discharge current; impulsive EMI effects; model; rise time; susceptibility; Electromagnetic fields; Electromagnetic interference; Electromagnetic modeling; Electrostatic discharge; Electrostatic interference; Humans; Laboratories; Low voltage; Physics; Power system modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE
Conference_Location
Toronto, Ont.
Print_ISBN
0-7803-1462-X
Type
conf
DOI
10.1109/IAS.1993.299099
Filename
299099
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