Title :
A phase noise spectrum test solution for high volume mixed signal/wireless automatic test equipments
Author :
Nam, Hui S. ; Cuddy, B. ; Luecking, Dieter
Author_Institution :
Teradyne Inc., Boston, MA, USA
Abstract :
To meet growing demands on a phase noise test solution for high volume radio frequency integrated circuits (RFICs), a phase noise analyzer based on a delay line FM demodulator operating at an intermediate frequency (IF) has been developed as an extension to an existing mixed-signal/wireless IC tester. The significant results from this effort are twofold. Firstly, the results from the first two devices show that it offers a unique set of performance trade-offs among accuracy, capital cost, throughput & measurement variance expected from the high volume production environment. Secondly, a detailed examination of IF based delay line FM demodulator revealed a significant set of instrumentation & calibration design issues which have not been fully explored by the previous works on this topic
Keywords :
automatic test equipment; delay lines; demodulators; electric noise measurement; frequency modulation; integrated circuit testing; mixed analogue-digital integrated circuits; phase noise; production testing; radiofrequency oscillators; spectral analysers; spectral analysis; FM demodulator; IF based delay line; calibration design; capital cost; delay line FM demodulator; high volume production environment; high volume radio frequency integrated circuits; intermediate frequency; mixed-signaLlwireless IC tester; performance trade-offs; phase noise test; Circuit testing; Costs; Delay lines; Demodulation; Integrated circuit noise; Integrated circuit testing; Phase noise; Radiofrequency integrated circuits; Throughput; Volume measurement;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966720
