DocumentCode :
1915349
Title :
Testability implications in low-cost integrated radio transceivers: a Bluetooth case study
Author :
Ozev, Sule ; Gaard, C. ; Orailoglu, Alex
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear :
2001
fDate :
2001
Firstpage :
965
Lastpage :
974
Abstract :
As the use of wireless communications in daily life increases, attaining low-cost solutions becomes increasingly important due to shrinking profit margins. Cost optimization that solely targets at minimization of the cost of system architecture may result in suboptimal, highly untestable, solutions. Test design and design for testability need to be incorporated into the system design flow to achieve viable solutions. This paper presents an analysis of test requirements, implications and test cost for low-cost Bluetooth systems. Testability problems are identified and possible solutions along with avenues to reduce the test cost by utilizing lower-cost testers are discussed
Keywords :
design for testability; frequency hop communication; phase noise; spread spectrum communication; telecommunication equipment testing; telecontrol; transceivers; DFT; PLL phase noise; RF testing; RMS phase noise; VCO phase noise; design for testability; low-cost Bluetooth systems; low-cost integrated radio transceivers; receiver architectures; specification-based tests; synthesizer specifications; test cost reduction; test design; testability problems; transceiver architectures; transmit architectures; wireless communications; Bit error rate; Bluetooth; Circuit testing; Computer aided software engineering; Cost function; Design for testability; Hardware; Radio frequency; Radio transceivers; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-7169-0
Type :
conf
DOI :
10.1109/TEST.2001.966721
Filename :
966721
Link To Document :
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