DocumentCode

1915398

Title

Scaling Down Effect on 1/f Noise in Thin Film Transistors

Author

Rhayem, J. ; Rigaud, D. ; Valenza, M. ; Szydlo, N. ; Lebrun, H.

Author_Institution

Universite Montpellier II, France

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

464

Lastpage

467

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

conf

Filename

1503589