مرکز منطقه ای اطلاع رساني علوم و فناوري - Scaling Down Effect on 1/f Noise in Thin Film Transistors

DocumentCode :

1915398

Title :

Scaling Down Effect on 1/f Noise in Thin Film Transistors

Author :

Rhayem, J. ; Rigaud, D. ; Valenza, M. ; Szydlo, N. ; Lebrun, H.

Author_Institution :

Universite Montpellier II, France

fYear :

1998

fDate :

8-10 Sept. 1998

Firstpage :

464

Lastpage :

467

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location :

Bordeaux, France

Print_ISBN :

2-86332-234-6

Type :

conf

Filename :

1503589

Link To Document :