DocumentCode :
1915409
Title :
High-Power Solid-State Switch Test Facility: applications and capabilities
Author :
Hughes, K.B.
Author_Institution :
Westinghouse Sci. & Technol. Center, Pittsburgh, PA, USA
fYear :
1993
fDate :
2-8 Oct 1993
Firstpage :
1305
Abstract :
The design and operation of the High-Power Solid-State Switch Test Facility are described. The development of flexible alternating current transmission system technologies in parallel with the continually increasing ratings of large gate turn-off (GTO) thyristor devices has resulted in new and unique demands on laboratory testing capabilities. The High-Power Solid-State Switch Test Facility was designed and built in order to meet these demands as an integral part of the design process for large GTO-based inverter programs. The ignitron switching scheme in conjunction with high-voltage low-inductance circuit construction has enabled designers to duplicate complex in service high-power switching conditions in the laboratory. The subsequent test results serve as the final verdict for equipment designs based on device data sheets and computer simulations. Rigorous test programs performed under stressful switching conditions aid in correcting reliability problems with power electronics equipment early in the design cycle. This development process results in a reliability improvement and a cost reduction of high-power solid-state converter hardware
Keywords :
high-voltage techniques; invertors; mercury arc rectifiers; power transmission; switching circuits; test facilities; thyristor applications; GTO; GTO-based inverter; High-Power Solid-State Switch Test Facility; flexible alternating current transmission system; gate turn-off thyristors; high-power switching conditions; high-voltage low-inductance circuit; ignitron switching scheme; Circuit testing; Electronic equipment testing; Laboratories; Process design; Solid state circuits; Switches; Switching circuits; System testing; Test facilities; Thyristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-1462-X
Type :
conf
DOI :
10.1109/IAS.1993.299106
Filename :
299106
Link To Document :
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