Title :
Reliability modelling with respect to circuit applications
Author :
Verweij, J.F. ; Mouthaan, A.J.
Author_Institution :
MESA Res. Inst., Univ. of Twente, Enschede, Netherlands
Abstract :
For a designer it is important to incorporate reliability aspects in his circuit simulator. This is done via the construction and incorporation of models for degradation mechanisms. In this paper we review benefits, necessary conditions and relevant parameters. Moreover, some examples are given of achievements in this field.
Keywords :
circuit reliability; circuit simulation; network synthesis; circuit applications; circuit simulator; degradation mechanisms; reliability aspects; reliability modelling; Analytical models; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Degradation; Dielectrics; Resistors; Temperature; Transistors;
Conference_Titel :
Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European
Conference_Location :
Grenoble
