Automated and adaptive RF effects testing

Testing electronics for vulnerability to radio frequency (RF) radiation is time-consuming, due to the large number of source variables of interest, including center frequency, pulse width, pulse repetition frequency, number of pulses, and bandwidth. One must intelligently select the source parameters most likely to expose the greatest vulnerability. We do so here using standard techniques from minimization theory. Within a space of two or more variables, we search for the combination that upsets the system at the lowest power or field level. We investigated the vulnerability of media converters to pulsed RF fields, by pinging a remote computer.