• DocumentCode
    1915859
  • Title

    Pin electronics IC for high speed differential devices

  • Author

    Oshima, Atsushi ; Poniatowski, John ; Nomura, Toshihiro

  • Author_Institution
    Schlumberger Semicond. Solutions, Kanagawa, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1128
  • Lastpage
    1133
  • Abstract
    The pin electronics IC (PEIC) was developed for testing high speed, differential devices up to 3.2 Gbps. Each PEIC has a fully differential driver and comparator with a selector. The calibration method for differential comparator is also discussed
  • Keywords
    calibration; comparators (circuits); driver circuits; integrated circuit testing; peripheral interfaces; test equipment; timing; 3.2 Gbit/s; PEIC; calibration method; comparator; differential comparator; differential devices; fully differential driver; high speed differential device testing; pin electronics IC; selector; testing; Circuit testing; Crosstalk; Driver circuits; Electronic equipment testing; High speed integrated circuits; Low voltage; Pins; Switches; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966739
  • Filename
    966739
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1915859