DocumentCode :
1915912
Title :
When zero picoseconds edge placement accuracy is not enough
Author :
Cheng, John
Author_Institution :
Teradyne Inc., Boston, MA, USA
fYear :
2001
fDate :
2001
Firstpage :
1134
Lastpage :
1142
Abstract :
In the last ten years, test equipment suppliers have driven improvements in edge placement accuracy taking it from ±225ps to sub-100ps through a combination of architectural improvements and new calibration technology. However with the adoption of high speed source synchronous buses such as HyperTransport and RapidIO on high performance devices, it is no longer sufficient to just look at the tester EPA component in the overall timing budget. Although test system accuracy is still very important, error terms from the DUT must also be considered. The proposed methodology of device strobed comparators addresses both test system and device error terms
Keywords :
automatic test equipment; calibration; comparators (circuits); synchronisation; system buses; 225 to 100 ps; HyperTransport; RapidIO; burst time optimization; calibration; device strobed comparators; edge placement accuracy; errors; high speed source synchronous buses; sweeping window; test equipment; timing budget; Application software; Bandwidth; Clocks; Fabrics; Microprocessors; Multimedia databases; Switches; System testing; Test equipment; Transmitters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-7169-0
Type :
conf
DOI :
10.1109/TEST.2001.966740
Filename :
966740
Link To Document :
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