A stand-alone integrated test core for time and frequency domain measurements

Author

Hafed, Mohamed ; Abaskharoun, Nazmy ; Roberts, Gordon W.

Author_Institution

Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada

fYear

2001

fDate

2001

Firstpage

1190

Lastpage

1199

Abstract

An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstruction filter and a comparator. It is capable of both generating arbitrary band-limited waveforms (for excitation purposes) and coherently digitizing arbitrary periodic analog waveforms (for DSP-based test and measurement). A prototype IC was fabricated in a 3.3 V 0.35 μm CMOS process. It was demonstrated to perform various curve tracing, timing, and spectrum analysis tasks at a sampling frequency of 20 MHz (which was only limited by our experimental setup) while taking up an area equivalent to only about five thousand standard-cell 2-input NAND gates

Keywords

CMOS integrated circuits; automatic test equipment; comparators (circuits); computer architecture; digital signal processing chips; frequency-domain analysis; integrated circuit testing; mixed analogue-digital integrated circuits; spectral analysis; time-domain analysis; 0.35 μm; 0.35 micron; 20 MHz; 3.3 V; DSP-based test; arbitraly periodic analog waveforms; band-limited waveforms; comparator; integrated test core; mixed-signal circuits; prototype IC; reconstruction filter; standard-cell 2input NAND gates; CMOS integrated circuits; CMOS process; Circuit testing; Digital filters; Frequency domain analysis; Integrated circuit measurements; Performance analysis; Prototypes; Robustness; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2001. Proceedings. International

Conference_Location

Baltimore, MD

ISSN

1089-3539

Print_ISBN

0-7803-7169-0

Type

conf

DOI

10.1109/TEST.2001.966743

Filename

966743