Title :
Vulnerability of Zigbee to impulsive noise in electricity substations
Author :
Bhatti, S A ; Shan, Qingshan ; Atkinson, R. ; Vieira, M. ; Glover, I.A.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Strathclyde, Glasgow, UK
Abstract :
The vulnerability of Zigbee technology to noise in an electricity substation environment is assessed. Substation noise obtained from a measurement campaign is modelled as a Symmetric α-Stable process. The parameters of the model are estimated from the measurements and the resulting model is used to investigate the likely BER performance of Zigbee technology deployed in a substation.
Keywords :
Zigbee; error statistics; impulse noise; substations; BER performance; Zigbee; electricity substation; impulsive noise; substation noise; symmetric α-stable process; Bit error rate; Electricity; Noise; Receivers; Substations; Wireless sensor networks; Zigbee;
Conference_Titel :
General Assembly and Scientific Symposium, 2011 XXXth URSI
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-5117-3
DOI :
10.1109/URSIGASS.2011.6050729
