Title :
High level modifications of VHDL descriptions for on-line test or fault tolerance
Author :
Leveugle, R. ; Cercueil, R.
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
With the increasing probability of transient faults such as bit-flips due to SEUs and the increasing complexity of integrated circuits, the need for integrated mechanisms providing online error detection or fault tolerance is becoming a major concern, not only for classically critical applications, but also for circuits used in everyday life. This paper reports on a tool automating the implementation of some mechanisms by inserting modifications in high-level VHDL descriptions. The modifications are compatible with industrial design flows based on commercial synthesis and simulation tools. Implementation results are presented and compared with results previously obtained using a specific synthesis tool
Keywords :
fault tolerant computing; hardware description languages; high level synthesis; integrated circuit modelling; logic simulation; state assignment; transients; SEUs; VHDL descriptions; bit-flips; high level modifications; industrial design flows; probability; simulation tools; synthesis tool; transient faults; CMOS technology; Capacitance; Circuit faults; Circuit testing; Fault tolerance; Integrated circuit technology; Life testing; Power supplies; Single event transient; Space technology;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7695-1203-8
DOI :
10.1109/DFTVS.2001.966756