• DocumentCode
    1916325
  • Title

    Cavity QED photoelectric cell

  • Author

    Prevenslik, T.V. ; Shin, F.G. ; Mak, C.L.

  • Author_Institution
    2E Greenery Court, Discovery Bay, Hong Kong
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    54
  • Lastpage
    56
  • Abstract
    The current status in the development program of a cavity QED photoelectric cell is reported. The cell comprises a pair of silicon chips interacting with each other by electromagnetic (EM) radiation through a gap of microscopic dimensions. The gap between the interacting surfaces is less than 100 nm and forms a 1D cavity QED confinement with a resonance in the UV below 200 nm. The cell is driven by the collective EM radiation emitted from the silicon surface that is described by the absorption (and emission) spectrum of the silicon surface. The cell voltage depends on the photoelectric effect caused by the difference between Planck energy at UV frequencies and the work function of silicon whereas the photoelectric current depends on the quantum efficiency of the silicon surface. To compensate for the lowering of temperature of the silicon surface caused by the conversion of Planck energy loss at UV frequencies to free electrons, the cell recharges itself from the thermal energy freely available in the ambient surroundings
  • Keywords
    elemental semiconductors; photoelectric cells; quantum electrodynamics; silicon; work function; 1D cavity QED confinement; Planck energy; Si; absorption spectrum; cavity QED photoelectric cell; cell voltage; collective EM radiation; emission spectrum; microscopic gap; photoelectric current; photoelectric effect; work function; Electromagnetic radiation; Electromagnetic wave absorption; Energy loss; Frequency; Microscopy; Photovoltaic effects; Resonance; Silicon; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1999. Proceedings. 1999 IEEE Hong Kong
  • Conference_Location
    Shatin
  • Print_ISBN
    0-7803-5648-9
  • Type

    conf

  • DOI
    10.1109/HKEDM.1999.836407
  • Filename
    836407