Title :
Novel approaches for fault detection in two-dimensional combinational arrays
Author :
Chen, X.T. ; Huang, W.-K. ; Park, N. ; Meyer, F.J. ; Lombardi, Floriana
Author_Institution :
Lucent Technol., Allentown, PA, USA
Abstract :
This paper presents new approaches for the constant (C)-testability of orthogonal (two-dimensional) arrays of combinational cells. A novel testability condition referred to as CO-testability is introduced: a testing approach for CO-testability is fully characterized based on adding states to the table of a cell. A second approach is also proposed. this approach is based on adding a variable number of additional states to a cell with a known table. This approach requires at most (m+k+α)(n+k+α)( m/k+1)(n/k+1) tests, where m and n are the number of states in the two dimensions of signal flow, α=1(0) if (partial) fail observability is applicable to the state table and k is the variable number of additional states per direction (2⩽k⩽m.n). As an example, the proposed approaches have been applied to a two-dimensional array for maximum/minimum comparison
Keywords :
cellular arrays; combinational circuits; fault diagnosis; logic arrays; logic testing; observability; 2D combinational arrays; CO-testability; combinational cells; constant testability; fault detection; maximum/minimum comparison; observability; orthogonal arrays; testability condition; two-dimensional arrays; Fault detection; Fault tolerant systems; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7695-1203-8
DOI :
10.1109/DFTVS.2001.966765