Title :
Nondestructive measurement for multilayer inhomogeneous material based on multiresolution analysis
Author_Institution :
Dept. of Appl. Math., Zhejiang Univ., China
Abstract :
In this paper, a new and effective method based on multiresolution analysis (wavelet analysis) is proposed. It is used to nondestructively reconstruct the depth distribution of optical-absorption coefficient in multilayer inhomogeneous material with the photothermal signals which are related to the surface temperature of a sample. Numerical simulations and experimental data show that this method is feasible and the performance of the approach is better
Keywords :
absorption coefficients; multilayers; nondestructive testing; photothermal effects; wavelet transforms; depth distribution; diode; multilayer inhomogeneous material; multiresolution analysis; nondestructive measurement; numerical simulations; optical absorption; optical-absorption coefficient; photothermal signals; surface temperature; wavelet analysis; Absorption; Light emitting diodes; Multiresolution analysis; Nitrogen; Nonhomogeneous media; Optical materials; Optical modulation; Optical surface waves; Solids; Temperature;
Conference_Titel :
Electron Devices Meeting, 1999. Proceedings. 1999 IEEE Hong Kong
Conference_Location :
Shatin
Print_ISBN :
0-7803-5648-9
DOI :
10.1109/HKEDM.1999.836422
