Title :
A testing instrument for dynamic contact resistance
Author :
Wenhua, Li ; Zhigang, Li
Author_Institution :
Electr. Apparatus Inst., Hebei Univ. of Technol., Tianjin, China
Abstract :
A mathematical model of the contact resistance of electrical apparatus contacts and its dynamic changing law are discussed, and a new testing instrument for the dynamic contact process of low-capacitance contacts (mainly relay contacts) is introduced
Keywords :
automatic test equipment; contact resistance; electrical contacts; relays; reliability; dynamic changing law; dynamic contact resistance; electrical apparatus contact; low-capacitance contact; mathematical model; periodic automatic test; relay contact; testing instrument; Bridge circuits; Capacitance; Contact resistance; Electric resistance; Electric variables measurement; Electrical resistance measurement; Instruments; Relays; Surface resistance; Testing;
Conference_Titel :
Electron Devices Meeting, 1999. Proceedings. 1999 IEEE Hong Kong
Conference_Location :
Shatin
Print_ISBN :
0-7803-5648-9
DOI :
10.1109/HKEDM.1999.836423
