• DocumentCode
    1916732
  • Title

    Off-line Testing of Crosstalk Induced Glitch Faults in NoC Interconnects

  • Author

    Bengtsson, Tomas ; Kumar, Shashi ; Ubar, Raimund ; Jutman, Artur

  • Author_Institution
    Jonkoping Univ.
  • fYear
    2006
  • fDate
    Nov. 2006
  • Firstpage
    221
  • Lastpage
    225
  • Abstract
    Crosstalk induced faults, like delay faults and glitch faults, are becoming important to test for high density SoCs operating at high clock speeds. In this paper, the authors propose a methodology for at-speed testing of glitch faults in links connecting two distinct clock domains in a SoC or a NoC system. The basic idea is to try to create conditions using maximum number of aggressors to induce a glitch in the link to be tested for faults and use a latch to record this glitch. The authors illustrate our ideas for testing glitch faults in handshaking signals used for communication between two NoC switches. BIST structure for off-line testing of these faults is also briefly described
  • Keywords
    built-in self test; crosstalk; fault simulation; integrated circuit interconnections; network-on-chip; BIST structure; NoC interconnects; NoC switches; crosstalk induced faults; delay faults; fault testing; glitch faults; high density SoC; off-line testing; Circuit faults; Circuit testing; Clocks; Communication switching; Crosstalk; Integrated circuit interconnections; Logic; Network-on-a-chip; Switches; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Norchip Conference, 2006. 24th
  • Conference_Location
    Linkoping
  • Print_ISBN
    1-4244-0772-9
  • Type

    conf

  • DOI
    10.1109/NORCHP.2006.329215
  • Filename
    4126986