DocumentCode :
1916732
Title :
Off-line Testing of Crosstalk Induced Glitch Faults in NoC Interconnects
Author :
Bengtsson, Tomas ; Kumar, Shashi ; Ubar, Raimund ; Jutman, Artur
Author_Institution :
Jonkoping Univ.
fYear :
2006
fDate :
Nov. 2006
Firstpage :
221
Lastpage :
225
Abstract :
Crosstalk induced faults, like delay faults and glitch faults, are becoming important to test for high density SoCs operating at high clock speeds. In this paper, the authors propose a methodology for at-speed testing of glitch faults in links connecting two distinct clock domains in a SoC or a NoC system. The basic idea is to try to create conditions using maximum number of aggressors to induce a glitch in the link to be tested for faults and use a latch to record this glitch. The authors illustrate our ideas for testing glitch faults in handshaking signals used for communication between two NoC switches. BIST structure for off-line testing of these faults is also briefly described
Keywords :
built-in self test; crosstalk; fault simulation; integrated circuit interconnections; network-on-chip; BIST structure; NoC interconnects; NoC switches; crosstalk induced faults; delay faults; fault testing; glitch faults; high density SoC; off-line testing; Circuit faults; Circuit testing; Clocks; Communication switching; Crosstalk; Integrated circuit interconnections; Logic; Network-on-a-chip; Switches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Norchip Conference, 2006. 24th
Conference_Location :
Linkoping
Print_ISBN :
1-4244-0772-9
Type :
conf
DOI :
10.1109/NORCHP.2006.329215
Filename :
4126986
Link To Document :
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