DocumentCode
1916732
Title
Off-line Testing of Crosstalk Induced Glitch Faults in NoC Interconnects
Author
Bengtsson, Tomas ; Kumar, Shashi ; Ubar, Raimund ; Jutman, Artur
Author_Institution
Jonkoping Univ.
fYear
2006
fDate
Nov. 2006
Firstpage
221
Lastpage
225
Abstract
Crosstalk induced faults, like delay faults and glitch faults, are becoming important to test for high density SoCs operating at high clock speeds. In this paper, the authors propose a methodology for at-speed testing of glitch faults in links connecting two distinct clock domains in a SoC or a NoC system. The basic idea is to try to create conditions using maximum number of aggressors to induce a glitch in the link to be tested for faults and use a latch to record this glitch. The authors illustrate our ideas for testing glitch faults in handshaking signals used for communication between two NoC switches. BIST structure for off-line testing of these faults is also briefly described
Keywords
built-in self test; crosstalk; fault simulation; integrated circuit interconnections; network-on-chip; BIST structure; NoC interconnects; NoC switches; crosstalk induced faults; delay faults; fault testing; glitch faults; high density SoC; off-line testing; Circuit faults; Circuit testing; Clocks; Communication switching; Crosstalk; Integrated circuit interconnections; Logic; Network-on-a-chip; Switches; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Norchip Conference, 2006. 24th
Conference_Location
Linkoping
Print_ISBN
1-4244-0772-9
Type
conf
DOI
10.1109/NORCHP.2006.329215
Filename
4126986
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