Title :
Present Understanding of Gate Oxide Wearout
Author :
Rosenbaum, Elyse ; Wu, Jie
Author_Institution :
University of Illinois at Urbana-Champaign, USA
fDate :
11-13 September 2000
Keywords :
Anodes; Breakdown voltage; Cathodes; Charge carrier processes; Electric breakdown; Electron traps; Lead compounds; Leakage current; Testing; Tunneling;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194717
