Compact fluorescent lamp adapter measurement with integrated system of virtual instrumentation

Author

Lou, Suping

Author_Institution

OSRAM Sylvania Inc., Danvers, MA, USA

fYear

1993

fDate

2-8 Oct 1993

Firstpage

2219

Abstract

A method of integrating compact fluorescent lamp (CFL) adapter measurements using virtual instrument software is presented. The program, CFL TEST VI, for CFL adapter testing is written in the graphical programming language LabVIEW. Important parameters such as input current, input wattage, lamp voltage, lamp current, and lamp wattage are acquired through an IEEE-488 interface. Data are analyzed and presented on a computer display as virtual meters and chart recorders. Lamp stabilization is determined by statistical analysis of the incoming data. The input and lamp current waveforms are transferred from the digital oscilloscope to the computer. The CFL TEST VI calculates the THD (total harmonic distortion) of the input line current, the RMS lamp current, the lamp current crest factor, etc. The VI then plots the input current waveform, lamp current waveform, and computed FFT (fast Fourier transform) waveform of the input current

Keywords

computerised instrumentation; electric current measurement; fast Fourier transforms; fluorescent lamps; harmonics; power measurement; software packages; stability; statistical analysis; voltage measurement; CFL TEST VI; IEEE-488 interface; LabVIEW; RMS; adapter measurement; chart recorders; compact fluorescent lamp; crest factor; digital oscilloscope; fast Fourier transform; graphical programming language; input current; input wattage; lamp current; lamp voltage; lamp wattage; stability; statistical analysis; total harmonic distortion; virtual instrument software; virtual meters; waveform; Computer displays; Computer languages; Data analysis; Fluorescent lamps; Instruments; Oscilloscopes; Software measurement; Statistical analysis; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE

Conference_Location

Toronto, Ont.

Print_ISBN

0-7803-1462-X

Type

conf

DOI

10.1109/IAS.1993.299177

Filename

299177