DocumentCode
1917181
Title
Reliability enhancement of analog-to-digital converters (ADCs)
Author
Singh, Mandeep ; Koren, Israel
Author_Institution
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
fYear
2001
fDate
2001
Firstpage
347
Lastpage
353
Abstract
The reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an ADC to convert the collected data to digital form and a digital unit to process it. The reliability of these systems is affected by the ability of its constituent blocks to tolerate faults. Therefore, it is necessary to increase the reliability of ADCs to ensure a highly reliable critical system. This paper illustrates the steps involved in the reliability enhancement of ADCs by first proposing a methodology for fault sensitivity analysis and then illustrating redesign techniques to improve the reliability of the highly sensitive(to faults) blocks
Keywords
analogue-digital conversion; fault diagnosis; fault tolerance; integrated circuit reliability; redundancy; sensitivity analysis; ADC reliability; fault sensitivity analysis; fault tolerance; folding/interpolating ADCs; highly reliable critical system; pattern detection; redesign techniques; redundancy; reliability enhancement; transistor sizing; Analog-digital conversion; Fault tolerant systems; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location
San Francisco, CA
ISSN
1550-5774
Print_ISBN
0-7695-1203-8
Type
conf
DOI
10.1109/DFTVS.2001.966788
Filename
966788
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