Title :
Study of testability design for complex electronic products
Author :
Kao-li, Huang ; Guang-yao, Lian ; Mian, Tian ; Xin-liao, Zheng
Author_Institution :
Dept. of Missile Eng., Ordnance Eng. Coll., Shijiazhuang
Abstract :
It mainly studies the testability design and analysis technology for complex electronic system for meeting the needs of design and product work and service work during using. It lucubrates testability design requests for the segments such as the partition for maintain level, the interface of test data, the interface of UUT and test equipments, during the processes of development, manufacturing and using, etc. The study is important to improve the testability level and realize integral test for electronic products
Keywords :
circuit testing; electron device manufacture; electronic products; product design; UUT interface; complex electronic products; maintain level partition; test data interface; testability analysis; testability design; Circuit faults; Circuit testing; Design for testability; Educational institutions; Electronic equipment testing; Missiles; Product design; Production facilities; Programmable logic arrays; System testing;
Conference_Titel :
Computer-Aided Industrial Design and Conceptual Design, 2006. CAIDCD '06. 7th International Conference on
Conference_Location :
Hangzhou
Print_ISBN :
1-4244-0683-8
Electronic_ISBN :
1-4244-0684-6
DOI :
10.1109/CAIDCD.2006.329311
