• DocumentCode
    1917358
  • Title

    Survivable self-checking sequential circuits

  • Author

    Levin, I. ; Matrosova, A. ; Ostanin, S.

  • Author_Institution
    Tel Aviv Univ., Israel
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    395
  • Lastpage
    402
  • Abstract
    This paper presents a method for designing totally self-checking synchronous sequential circuits (SSC), and investigates their behavior in presence of transient faults. We deal with the case when the circuit is able to recover after the number of clocks. We call SSC owing this property as a survivable SSC. A concept of a partially monotonous SSC is developed in the paper. It is proven that the partially monotonous SSCs are survivable
  • Keywords
    automatic testing; design for testability; integrated circuit reliability; logic design; logic testing; reliability theory; sequential circuits; transients; partially monotonous SSC; self checking synchronous sequential circuits; survivable SSC; transient faults; Fault tolerant systems; Sequential circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-1203-8
  • Type

    conf

  • DOI
    10.1109/DFTVS.2001.966793
  • Filename
    966793
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1917358