Title :
Fault-based side-channel cryptanalysis tolerant Rijndael symmetric block cipher architecture
Author :
Karri, Ramesh ; Wu, Kaijie ; Mishra, Piyush ; Kim, Yongkook
Author_Institution :
Dept. of ECE, Polytech. Univ. Brooklyn, NY, USA
Abstract :
Fault-based side channel cryptanalysis is very effective against symmetric and asymmetric encryption algorithms. Although straightforward hardware and time redundancy based Concurrent Error Detection (CED) architectures can be used to thwart such attacks, they entail significant overhead (either area or performance). In this paper we investigate systematic approaches to low-cost, low-latency CED for Rijndael symmetric encryption algorithm. These approaches exploit the inverse relationship that exists between Rijndael encryption and decryption at various levels and develop CED architectures that explore the trade-off between area overhead, performance penalty and error detection latency. The proposed techniques have been validated on FPGA implementations
Keywords :
cryptography; error detection; fault tolerance; fault tolerant computing; field programmable gate arrays; logic design; redundancy; FPGA; Rijndael symmetric encryption algorithm; area overhead; concurrent error detection; decrjption; error detection latency; fault-based side channel cryptanalysis; inverse relationship; petformance penalty; time redundancy; Computer architecture; Counting circuits; Cryptography; Hamming weight; Hardware; Radiation detectors; Redundancy; Software algorithms; Time measurement; Timing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7695-1203-8
DOI :
10.1109/DFTVS.2001.966796