• DocumentCode
    1917427
  • Title

    Study of Secondary Electron Injection Phenomena in Deep Sub-micron MOSFETs and Flash Cells

  • Author

    Xue, G. ; Van Houdt, J. ; Wellekens, D. ; Haspeslagh, L. ; Lorenzini, M. ; Keppens, B. ; Maes, H.

  • Author_Institution
    IMEC, Leuven, Belgium and KU Leuven, Belgium
  • fYear
    2000
  • fDate
    11-13 September 2000
  • Firstpage
    144
  • Lastpage
    147
  • Keywords
    CMOS logic circuits; Charge pumps; Electron traps; Flash memory cells; Logic devices; Logic programming; Low voltage; MOSFETs; Secondary generated hot electron injection; Split gate flash memory cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194735
  • Filename
    1503665
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1917427