• DocumentCode
    1917479
  • Title

    System-on-chip oriented fault-tolerant sequential systems implementation methodology

  • Author

    Pontarelli, S. ; Cardarilli, G.C. ; Malvoni, A. ; Ottavi, M. ; Re, M. ; Salsano, A.

  • Author_Institution
    Dept. of Electron. Eng., Rome Univ., Italy
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    455
  • Lastpage
    460
  • Abstract
    This paper presents a design methodology for fault tolerant sequential systems implemented on System on Chip (SoC). In the paper, as an example, a complex fault tolerant finite state machine has been mapped on the FPGA contained in the SoC. The fault identification has been obtained by using a checker permitting the identification of classes of faults. When a fault is detected, an interrupt for the microcontroller is generated and the interrupt handling routine partially reprograms the FPGA to override the part of memory configuring the faulty block. The architectures of the SoCs recently appeared on the market are characterized by a very efficient interaction between the microcontroller and the FPGA allowing a very efficient implementation of the fault detection and fault recovery strategy. A test bed of the proposed methodology has been implemented on the recently presented Atmel AT94K FPSLIC (Field Programmable System Level Integrated Circuits)
  • Keywords
    fault diagnosis; fault tolerant computing; field programmable gate arrays; finite state machines; integrated circuit design; integrated circuit reliability; logic testing; microcontrollers; sequential circuits; Atmel AT94K FPSLIC; FPGA; SoC; complex fault tolerant finite state machine; design methodology; fault class identification; fault detection; fault recovery strategy; field programmable system level integrated circuits; high reliability digital electronic systems; hostile environments; interrupt handling routine; microcontroller interrupt; parity check codes; partial reprogramming; system-on-chip oriented fault-tolerant sequential systems; Automata; Circuit faults; Circuit testing; Design methodology; Fault diagnosis; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Microcontrollers; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-1203-8
  • Type

    conf

  • DOI
    10.1109/DFTVS.2001.966799
  • Filename
    966799