A delta-sigma modulation based BIST scheme for mixed-signal systems

Author

Huang, Jiun-Lung ; Cheng, Kwung-Ting

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

fYear

2000

fDate

2000

Firstpage

147

Lastpage

152

Abstract

We present the architecture and analysis of a built-in self-test (BIST) scheme that targets mixed-signal system-on-chip (SOC) designs. The basic idea is to employ simple yet high-tolerant digital-to-analog (DA) and analog-to-digital (AD) conversion techniques for on-chip stimulus generation and response acquisition, and to utilize on-chip programmable cores for digital signal processing required for signal synthesis and response analysis. Numerical simulations are conducted to validate the idea and the results demonstrate the effectiveness of this BIST scheme

Keywords

built-in self test; delta-sigma modulation; integrated circuit testing; mixed analogue-digital integrated circuits; A/D conversion techniques; D/A conversion techniques; SOC designs; built-in self-test; delta-sigma modulation based BIST scheme; digital signal processing; mixed-signal systems; onchip programmable cores; onchip stimulus generation; response acquisition; response analysis; signal synthesis; system-on-chip designs; Built-in self-test; Circuit testing; Computer architecture; Delta modulation; Delta-sigma modulation; Digital modulation; Signal analysis; Signal generators; Transfer functions; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signal Design, 2000. SSMSD. 2000 Southwest Symposium on

Conference_Location

San Diego, CA

Print_ISBN

0-7803-5975-5

Type

conf

DOI

10.1109/SSMSD.2000.836463

Filename

836463