Title :
A New Physical Model for the Relaxation in Ferroelectrics
Author :
Kühn, C. ; Hönigschmid, H. ; Kowarik, O.
Author_Institution :
Universit¨at der Bundeswehr M¨unchen, Neubiberg, Germany
fDate :
11-13 September 2000
Keywords :
Capacitors; Circuit simulation; Ferroelectric materials; Hysteresis; Loss measurement; Polarization; Pulse measurements; Size measurement; Switches; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194740
