A dual edge transition based BIST approach for passive analog circuits

Author

Walker, Alvernon ; Lala, Parag K.

Author_Institution

Dept. of Electr. Eng., Tennessee Univ., Knoxville, TN, USA

fYear

2000

fDate

2000

Firstpage

179

Lastpage

181

Abstract

A new mixed-signal Built-in Self-Test (BIST) approach that is based upon voltage transitions at the primary output of the analog block under test (CUT) is presented in this paper. This CUT output is the pulse response of the CUT for a rail-to-rail pulse stream. The technique can effectively detect both soft and hard faults and does not require an analog-to-digital converter (ADC) or/and digital-to-analog converter (DAC). This approach also does not require any additional analog circuits to realize the test signal generator and sample circuits. The paper is concluded with an example of the application of the proposed approach for a passive second order notch filter

Keywords

analogue circuits; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; passive networks; dual edge transition based BIST approach; fault detection; hard faults; mixed-signal BIST; passive analog circuits; pulse response; rail-to-rail pulse stream; second order notch filter; soft faults; voltage transitions; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Digital-analog conversion; Electrical fault detection; Fault detection; Rail to rail outputs; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signal Design, 2000. SSMSD. 2000 Southwest Symposium on

Conference_Location

San Diego, CA

Print_ISBN

0-7803-5975-5

Type

conf

DOI

10.1109/SSMSD.2000.836469

Filename

836469