DocumentCode
1917864
Title
Series Resistances of Polysilicon Emitter Bipolar Transistors: Simulation and Measurement
Author
Dubois, Emmanuel ; Bricout, Paul-Henri ; Robilliart, Etienne
Author_Institution
IEMN/ISEN UMR CNRS 9929,41, Boulevard Vauban, 59046 Lille Cedex, France
fYear
1994
fDate
11-15 Sept. 1994
Firstpage
169
Lastpage
172
Keywords
Bipolar transistors; Charge carrier processes; Contact resistance; Current distribution; Electrical resistance measurement; Electron emission; Frequency; MONOS devices; Silicon; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
Conference_Location
Edinburgh, Scotland
Print_ISBN
0863321579
Type
conf
Filename
5435694
Link To Document