DocumentCode
1918038
Title
A 0.8 μm CMOS, Double Polysilicon EEPROM Technology Module Optimized for Minimum Wafer Cost
Author
Cacharelis, P. ; Hoffstetter, D. ; Schmidt, S. ; Nilles, J. ; Gough, J. ; Smillie, J.
Author_Institution
National Semiconductor Corp., Santa Clara, Ca., U.S.A. 95052
fYear
1994
fDate
11-15 Sept. 1994
Firstpage
195
Lastpage
198
Abstract
A novel process technology has been developed for "smart" analog and mixed-signal products requiring embedded EEPROM. The technology is a modular addition to a 0.8 μm, single polysilicon, double metal baseline CMOS process. The EEPROM process architecture is defined with the primary goal of minimizing the number of additional process steps driven by wafer cost considerations. A double polysilicon architecture is chosen to allow for the formation of an integral, linear interpoly capacitor and to reduce the EEPROM cell size. The module requires 3 additional masks beyond those of the baseline CMOS and adds 20% to the wafer cost. An anti-lock braking system (ABS) chip with a 64 byte EEPROM core has been designed and fabricated to demonstrate the technology.
Keywords
CMOS process; CMOS technology; Capacitors; Cost function; EPROM; Electrodes; Implants; MOS devices; Oxidation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
Conference_Location
Edinburgh, Scotland
Print_ISBN
0863321579
Type
conf
Filename
5435700
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