• DocumentCode
    1918038
  • Title

    A 0.8 μm CMOS, Double Polysilicon EEPROM Technology Module Optimized for Minimum Wafer Cost

  • Author

    Cacharelis, P. ; Hoffstetter, D. ; Schmidt, S. ; Nilles, J. ; Gough, J. ; Smillie, J.

  • Author_Institution
    National Semiconductor Corp., Santa Clara, Ca., U.S.A. 95052
  • fYear
    1994
  • fDate
    11-15 Sept. 1994
  • Firstpage
    195
  • Lastpage
    198
  • Abstract
    A novel process technology has been developed for "smart" analog and mixed-signal products requiring embedded EEPROM. The technology is a modular addition to a 0.8 μm, single polysilicon, double metal baseline CMOS process. The EEPROM process architecture is defined with the primary goal of minimizing the number of additional process steps driven by wafer cost considerations. A double polysilicon architecture is chosen to allow for the formation of an integral, linear interpoly capacitor and to reduce the EEPROM cell size. The module requires 3 additional masks beyond those of the baseline CMOS and adds 20% to the wafer cost. An anti-lock braking system (ABS) chip with a 64 byte EEPROM core has been designed and fabricated to demonstrate the technology.
  • Keywords
    CMOS process; CMOS technology; Capacitors; Cost function; EPROM; Electrodes; Implants; MOS devices; Oxidation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
  • Conference_Location
    Edinburgh, Scotland
  • Print_ISBN
    0863321579
  • Type

    conf

  • Filename
    5435700