Title :
Value creation and technological convergence by evolution of embedded non-volatile memory
Author_Institution :
Electron. Eng., Univ. of Tokyo, Tokyo
Abstract :
Flash-MCU, micro-controller with embedded flash memory storage (eFlash), has seen a tremendous up-surge in real-time control application markets, with assumed 20% CAGR. The programmable code storage provided by eFlash contributes to production cost reduction and real-time adaptive control applications, realizing a value innovation with remarkable cost/value advantage. The diversified advanced eFlash technology for converging flash-MCU products challenges new market drivers like automotive and smart-IC cards. Current status and future directions of flash-MCU in view of how on-chip programmability function evolution contributes to innovate MCU/SOC applications are overviewed. The 3rd generation MCU products as realized by NV-RAM concepts will drive a convergence into unified technology by value creation opportunities provided.
Keywords :
flash memories; microcontrollers; random-access storage; NV-RAM concepts; eFlash technology; embedded flash memory storage; embedded nonvolatile memory; microcontroller; onchip programmability function; programmable code storage; real-time adaptive control applications; real-time control application; Adaptive control; Automotive engineering; Consumer electronics; Costs; Flash memory; Nonvolatile memory; Production; Random access memory; Solid state circuits; Technological innovation;
Conference_Titel :
Memory Technology, Design and Testing, 2007. MTDT 2007. IEEE International Workshop on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-1656-1
Electronic_ISBN :
1087-4852
DOI :
10.1109/MTDT.2007.4547604