• DocumentCode
    1918166
  • Title

    Future trend of flash memories

  • Author

    Yi-Chou Chen ; Liu, Richard

  • fYear
    2007
  • fDate
    3-5 Dec. 2007
  • Firstpage
    17
  • Lastpage
    18
  • Abstract
    Summary form only given. Flash memories have provided reliable solid-state storage solutions for over twenty years. In the last few years we have seen an explosive growth of NAND flash, fueled by digital camera, USB, MP3, iPhone and numerous new mobile applications. However, this phenomenal boom is silently threatened by scaling limitations intrinsically built into the flash devices. Old challenges such as scaling the charge tunneling oxide have remained unconquered (and now proven unconquerable) for nearly a decade, and new challenges such as floating gate cross talk become more serious with scaling. Will flash technology be simply a brief flash in the history of semiconductor? In this talk we will start with the flash memory technology and market trend. We will then discuss the scaling issues for NOR and NAND floating gate devices, and their fundamental limitations. Potential solutions, including both new devices and architecture and completely new types of non-volatile memory will then be discussed. Recent progresses in new NAND and NOR flash memory solutions or substitutes such as TANOS, BE-SONOS, 3D stacking and phase change memory will be examined in considerable details.
  • Keywords
    flash memories; logic gates; 3D stacking; BE-SONOS; NAND floating gate device; NOR floating gate device; TANOS; flash memory; market trend; nonvolatile memory; phase change memory; Digital audio players; Digital cameras; Explosives; Flash memory; History; Nonvolatile memory; Solid state circuits; Stacking; Tunneling; Universal Serial Bus;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 2007. MTDT 2007. IEEE International Workshop on
  • Conference_Location
    Taipei
  • ISSN
    1087-4852
  • Print_ISBN
    978-1-4244-1656-1
  • Electronic_ISBN
    1087-4852
  • Type

    conf

  • DOI
    10.1109/MTDT.2007.4547607
  • Filename
    4547607