• DocumentCode
    1918245
  • Title

    An RF-insensitive hybrid electroexplosive device incorporating an integral filter

  • Author

    Henderson, John H. ; Baginski, Thomas A.

  • Author_Institution
    Dept. of Electr. Eng., Auburn Univ., AL, USA
  • fYear
    1993
  • fDate
    2-8 Oct 1993
  • Firstpage
    2483
  • Abstract
    As electroexplosive devices (EEDs) are increasingly exposed to the general public, their possible accidental initiation due to their susceptibility to electromagnetic interference (EMI) becomes a greater concern. Unintended signals coupled to the EED have usually been attenuated by the insertion of an L-C filter in the leads of the EED. However, these have typically been bulky, heavy, and expensive, and can often not be installed close to the EED itself, thereby reducing the effectiveness of the filter. The authors discuss a filter and an EED which are mounted on the same substrate using hybrid microelectronics technology and surface-mount components. The resulting structure is small, lightweight, inexpensive, and mechanically robust. Also demonstrated is a new EMI-insensitive EED, the semiconductor junction igniter. An electrical model was developed for the filter and EED, and it was verified with impedance measurements. Voltage attenuation and power dissipation were calculated, and the temperature of the devices under excitation was measured, to demonstrate the effectiveness of the filter
  • Keywords
    electric ignition; elemental semiconductors; etching; explosions; filters; mining; radiofrequency interference; safety; semiconductor devices; semiconductor technology; silicon; surface mount technology; L-C filter; Si; accidental initiation; electrical model; electromagnetic interference; excitation; hybrid electroexplosive device; impedance measurements; integral filter; microelectronics technology; power dissipation; safety; semiconductor junction igniter; substrate; surface-mount components; susceptibility; temperature; voltage attenuation; Electromagnetic interference; Filters; Impedance measurement; Microelectronics; Optical attenuators; Power dissipation; Robustness; Substrates; Surface-mount technology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE
  • Conference_Location
    Toronto, Ont.
  • Print_ISBN
    0-7803-1462-X
  • Type

    conf

  • DOI
    10.1109/IAS.1993.299229
  • Filename
    299229