DocumentCode :
1918624
Title :
Workshop schedule
fYear :
2007
fDate :
3-5 Dec. 2007
Firstpage :
73
Lastpage :
75
Abstract :
Provides a schedule of conference events and a listing of which papers were presented in each session.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design and Testing, 2007. MTDT 2007. IEEE International Workshop on
Conference_Location :
Taipei
ISSN :
1087-4852
Print_ISBN :
978-1-4244-1656-1
Type :
conf
DOI :
10.1109/MTDT.2007.4547625
Filename :
4547625
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1918624