DocumentCode
1918633
Title
A comparison between semi-classical and quantum-mechanical escape-times for gate current calculations
Author
Serra, A. Dalla ; Abramo, A. ; Palestri, P. ; Selmi, L. ; Widdershoven, F.
Author_Institution
University of Udine, Italy
fYear
2000
fDate
11-13 September 2000
Firstpage
340
Lastpage
343
Keywords
Eigenvalues and eigenfunctions; Electrons; Gate leakage; Laboratories; Leakage current; MOS capacitors; MOSFET circuits; Quantum computing; Testing; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN
2-86332-248-6
Type
conf
DOI
10.1109/ESSDERC.2000.194784
Filename
1503714
Link To Document