Title :
A comparison between semi-classical and quantum-mechanical escape-times for gate current calculations
Author :
Serra, A. Dalla ; Abramo, A. ; Palestri, P. ; Selmi, L. ; Widdershoven, F.
Author_Institution :
University of Udine, Italy
fDate :
11-13 September 2000
Keywords :
Eigenvalues and eigenfunctions; Electrons; Gate leakage; Laboratories; Leakage current; MOS capacitors; MOSFET circuits; Quantum computing; Testing; Tunneling;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194784
