DocumentCode
1918718
Title
A Simple and Accurate Deep Submicron Mismatch Model
Author
Croon, J.A. ; Rosmeulen, M. ; Decoutere, S. ; Sansen, W. ; Maes, H.E.
Author_Institution
IMEC, Leuven, Belgium and KU Leuven, Belgium
fYear
2000
fDate
11-13 September 2000
Firstpage
356
Lastpage
359
Keywords
CMOS analog integrated circuits; CMOS digital integrated circuits; Circuit synthesis; Electronic mail; Equations; MOSFETs; Parameter extraction; Physics; Semiconductor device modeling; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN
2-86332-248-6
Type
conf
DOI
10.1109/ESSDERC.2000.194788
Filename
1503718
Link To Document