Title :
A Simple and Accurate Deep Submicron Mismatch Model
Author :
Croon, J.A. ; Rosmeulen, M. ; Decoutere, S. ; Sansen, W. ; Maes, H.E.
Author_Institution :
IMEC, Leuven, Belgium and KU Leuven, Belgium
fDate :
11-13 September 2000
Keywords :
CMOS analog integrated circuits; CMOS digital integrated circuits; Circuit synthesis; Electronic mail; Equations; MOSFETs; Parameter extraction; Physics; Semiconductor device modeling; Threshold voltage;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194788
