DocumentCode :
1918838
Title :
Electrical Properties of 0.1 μm and Sub-0.1 μm Single-Drain and LDD MOSFETs from Room to Liquid Helium Temperatures
Author :
Balestra, F. ; Tsuno, M. ; Matsumoto, T. ; Koyanagi, M.
Author_Institution :
Faculty of Engineering, Tohoku University, Aramaki, Aoba-ku, Sendai 980, Japan; Laboratoire de Physique des Composants a Semiconducteurs (URA-CNRS), Institut National Polytechnique de Grenoble, ENSERG - BP 257, 38016 Grenoble, France
fYear :
1994
fDate :
11-15 Sept. 1994
Firstpage :
321
Lastpage :
324
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
Conference_Location :
Edinburgh, Scotland
Print_ISBN :
0863321579
Type :
conf
Filename :
5435727
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1918838
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