• DocumentCode
    1918933
  • Title

    3-D Simulation of Low Pressure Chemical Vapor Deposition

  • Author

    Bar, Eberhard ; Lorenz, J.

  • Author_Institution
    Fraunhofer-Institut fÿr Integrierte Schaltungen, Bereich Bauelementetechnologie, Schottkystrasse 10, D-91058 Erlangen, Germany
  • fYear
    1994
  • fDate
    11-15 Sept. 1994
  • Firstpage
    335
  • Lastpage
    338
  • Abstract
    A new method for the three-dimensional (3-D) simulation of LPCVD using a modified string algorithm combined with a redistribution model is presented. Simulation results for rectangular holes are shown. The step coverage predicted by 3-D simulations is compared to step coverages from 2-D simulations. It is shown that the considerable differences observed require the use of 3-D algorithms for the simulation of LPCVD in deep submicron devices.
  • Keywords
    Chemical vapor deposition; Computational modeling; Equations; Information geometry; Kinetic theory; Predictive models; Probability; Semiconductor device modeling; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
  • Conference_Location
    Edinburgh, Scotland
  • Print_ISBN
    0863321579
  • Type

    conf

  • Filename
    5435730