Title :
The Orientation Dependence of the Piezojunction Effect in Bipolar Transistors
Author :
Creemer, J.F. ; French, P.J.
Author_Institution :
Delft University of Technology, The Netherlands
fDate :
11-13 September 2000
Keywords :
Bipolar transistors; Compressive stress; Current measurement; Electronics packaging; Instruments; Mechanical factors; Silicon; Stress measurement; Tensile stress; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194803
