Title :
Ensuring of Microwave Circuit Quality Performance using the Method of Probablistic Modeling
Author :
Gudkov, A.G. ; Leushin, V.Yu. ; Meshkov, S.A.
Author_Institution :
Hyperion Ltd., Moscow
Abstract :
Forecasting problems concerned with technological dispersion of electrical parameter, product yield and synthesis of microwave circuit topology parameters and semiconductor heterostructure by criterion of maximum product yield are analyzed at constant technological accuracy. The prediction technique is offered and oriented for CAD system.
Keywords :
circuit CAD; microwave circuits; network topology; probability; CAD system; electrical parameter dispersion; microwave circuit topology synthesis; prediction technique; probablistic modeling; semiconductor heterostructure; Microwave circuits; Microwave theory and techniques; Optimized production technology;
Conference_Titel :
Microwave & Telecommunication Technology, 2007. CriMiCo 2007. 17th International Crimean Conference
Conference_Location :
Crimea
Print_ISBN :
978-966-335-012-7
DOI :
10.1109/CRMICO.2007.4368834
