DocumentCode
1919262
Title
Ensuring of Microwave Circuit Quality Performance using the Method of Probablistic Modeling
Author
Gudkov, A.G. ; Leushin, V.Yu. ; Meshkov, S.A.
Author_Institution
Hyperion Ltd., Moscow
fYear
2007
fDate
10-14 Sept. 2007
Firstpage
523
Lastpage
524
Abstract
Forecasting problems concerned with technological dispersion of electrical parameter, product yield and synthesis of microwave circuit topology parameters and semiconductor heterostructure by criterion of maximum product yield are analyzed at constant technological accuracy. The prediction technique is offered and oriented for CAD system.
Keywords
circuit CAD; microwave circuits; network topology; probability; CAD system; electrical parameter dispersion; microwave circuit topology synthesis; prediction technique; probablistic modeling; semiconductor heterostructure; Microwave circuits; Microwave theory and techniques; Optimized production technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2007. CriMiCo 2007. 17th International Crimean Conference
Conference_Location
Crimea
Print_ISBN
978-966-335-012-7
Type
conf
DOI
10.1109/CRMICO.2007.4368834
Filename
4368834
Link To Document