• DocumentCode
    1919283
  • Title

    Predicting reliability in design of complex systems with common-cause failures and time-varying failure rates

  • Author

    Littlefield, Scott ; Mazzuchi, Thomas ; Sarkani, Shahram

  • Author_Institution
    Sch. of Eng. & Appl. Sci., George Washington Univ., Washington, DC, USA
  • fYear
    2012
  • fDate
    19-22 March 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    One of the challenges in designing complex systems is determining the reliability benefit of redundant and back-up components. Traditional reliability theory assumes that component failures are independent, which tends to over-predict the improvement provided by redundancy. Various “Common Cause Failure” approaches have been developed to model the actual dependency between nominally independent components. However, these approaches rely on the simplifying assumption that component failure rates and common-cause event rates are constant. This assumption may not be accurate; however, a closed form solution may not otherwise be achievable. An alternative approach using discrete event simulation can evaluate the reliability of complex systems when closed form solutions aren´t achievable; in particular under the condition that individual component failure rates and common cause event rates are time-dependent. This research develops an approach to modeling common cause failures that can accommodate time-varying failure rates.
  • Keywords
    discrete event simulation; large-scale systems; reliability theory; common-cause event rates; common-cause failures; complex systems design; component failure rates; discrete event simulation; reliability prediction; reliability theory; time-varying failure rates; Discrete event simulation; Fault trees; Mathematical model; Probabilistic logic; Reliability engineering; Risk management; common cause failures; discrete event simulation; probabalistic risk assessment; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems Conference (SysCon), 2012 IEEE International
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    978-1-4673-0748-2
  • Type

    conf

  • DOI
    10.1109/SysCon.2012.6189455
  • Filename
    6189455