DocumentCode :
1919534
Title :
Thermal analysis and validation of MCMs
Author :
Pollard, Lloyd L. ; Salskov, Eric ; Lee, Seri
Author_Institution :
Platform Archit. Lab., Intel Corp., Hillsboro, OR, USA
fYear :
2000
fDate :
2000
Firstpage :
140
Lastpage :
146
Abstract :
A thermal analysis methodology has been developed for modules with multiple heat sources to expedite the thermal design cycle, the majority of which takes place prior to the delivery of functional silicon. This methodology utilizes linear superposition to comprehend interactions between various heat sources within an MCM. Therefore, it is applicable to designs where material properties can be assumed constant with respect to the temperature range of interest. In design applications, this methodology can be used with good results for forced convection boundary conditions, as well as (within acceptable design limitations) natural convection boundary conditions. A case study is presented herein to demonstrate the analysis techniques and to validate the method using experimental data. Although design specific data has not been incorporated here, this methodology proved its usefulness in the next generation DRAM thermal design
Keywords :
DRAM chips; forced convection; heat sinks; integrated circuit testing; multichip modules; natural convection; semiconductor device testing; thermal analysis; thermal variables measurement; thermocouples; DRAM thermal design; MCM; design applications; forced convection boundary conditions; linear superposition; multiple heat sources; natural convection boundary conditions; thermal analysis; thermal design cycle; validation; Analytical models; Boundary conditions; Material properties; Power distribution; Temperature distribution; Temperature sensors; Thermal conductivity; Thermal engineering; Thermal loading; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2000. Sixteenth Annual IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-5916-X
Type :
conf
DOI :
10.1109/STHERM.2000.837076
Filename :
837076
Link To Document :
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