• DocumentCode
    1919534
  • Title

    Thermal analysis and validation of MCMs

  • Author

    Pollard, Lloyd L. ; Salskov, Eric ; Lee, Seri

  • Author_Institution
    Platform Archit. Lab., Intel Corp., Hillsboro, OR, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    140
  • Lastpage
    146
  • Abstract
    A thermal analysis methodology has been developed for modules with multiple heat sources to expedite the thermal design cycle, the majority of which takes place prior to the delivery of functional silicon. This methodology utilizes linear superposition to comprehend interactions between various heat sources within an MCM. Therefore, it is applicable to designs where material properties can be assumed constant with respect to the temperature range of interest. In design applications, this methodology can be used with good results for forced convection boundary conditions, as well as (within acceptable design limitations) natural convection boundary conditions. A case study is presented herein to demonstrate the analysis techniques and to validate the method using experimental data. Although design specific data has not been incorporated here, this methodology proved its usefulness in the next generation DRAM thermal design
  • Keywords
    DRAM chips; forced convection; heat sinks; integrated circuit testing; multichip modules; natural convection; semiconductor device testing; thermal analysis; thermal variables measurement; thermocouples; DRAM thermal design; MCM; design applications; forced convection boundary conditions; linear superposition; multiple heat sources; natural convection boundary conditions; thermal analysis; thermal design cycle; validation; Analytical models; Boundary conditions; Material properties; Power distribution; Temperature distribution; Temperature sensors; Thermal conductivity; Thermal engineering; Thermal loading; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2000. Sixteenth Annual IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-5916-X
  • Type

    conf

  • DOI
    10.1109/STHERM.2000.837076
  • Filename
    837076