Title :
Switching Behaviour and Noise of Soft Breakdown Current in Ultra-Thin Gate Oxides
Author :
Cester, A. ; Paccagnella, A. ; Bandiera, L. ; Ghidini, G.
Author_Institution :
Università di Padova, Italy
fDate :
11-13 September 2000
Keywords :
Carbon capture and storage; Current density; Current measurement; Degradation; Electric breakdown; Fluctuations; Frequency; Stress; Telegraphy; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194824
