Title :
On the Noise in Dynamic Threshold (DT) MOS/SOI Transistors
Author :
Haendler, S. ; Jomaah, J. ; Balestra, F. ; Pelloie, J.L.
Author_Institution :
LPCS/ENSERG, Grenoble, France
fDate :
11-13 September 2000
Keywords :
Clamps; Current limiters; Frequency; Impact ionization; Linear predictive coding; Low-frequency noise; MOSFETs; Transconductance; Voltage; Wireless communication;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194825
