Title :
Investigation of 3D Phenomena in the Triggering of gg-nMOS Electrostatic Discharge Protection Devices
Author :
Litzenberger, M. ; Fürböck, C. ; Pogany, D. ; Gornik, E. ; Esmark, K. ; Gossner, H.
Author_Institution :
Vienna University of Technology, Austria
fDate :
11-13 September 2000
Keywords :
Bipolar transistors; Current density; Current measurement; Electrical resistance measurement; Electrostatic discharge; Electrostatic interference; Laser beams; MOS devices; Protection; Thermal stresses;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194829
