Title :
Performance Analysis of SiGe-Base BJTs
Author :
Pellegrini, A. ; Colalongo, L. ; Gnudi, A. ; Rudan, M.
Author_Institution :
UniversitÃ\xa0 di Bologna, viale Risorgimento 2, 40136 Bologna, Italy, Tel. +39-(51)-644-3016, Fax. -3073
Keywords :
Analytical models; Cutoff frequency; Doping; Germanium silicon alloys; Impurities; Lattices; Numerical analysis; Performance analysis; Predictive models; Silicon germanium;
Conference_Titel :
Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
Conference_Location :
Edinburgh, Scotland
