• DocumentCode
    1920177
  • Title

    RF-CMOS Performance Trends

  • Author

    Woerlee, P.H. ; Langevelde, R. Van ; Montree, A.H. ; Klaassen, D.B.M. ; Tiemeijer, L.F. ; de Vreede, P.W.H.

  • Author_Institution
    Philips Research Laboratories, Eindhoven, The Netherlands
  • fYear
    2000
  • fDate
    11-13 September 2000
  • Firstpage
    576
  • Lastpage
    579
  • Keywords
    CMOS technology; Cutoff frequency; Electrical resistance measurement; Equations; Fingers; Linearity; MOS devices; Parasitic capacitance; Radio frequency; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194843
  • Filename
    1503773
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1920177