DocumentCode :
1920237
Title :
Dependence of Channel Width and Length on MOSFET Matching for 0.18 um CMOS Technology
Author :
Difrenza, R. ; Llinares, P. ; Ghibaudo, G. ; Robillart, E. ; Granger, E.
Author_Institution :
STMicroelectronics, Crolles Cedex, France
fYear :
2000
fDate :
11-13 September 2000
Firstpage :
584
Lastpage :
587
Keywords :
CMOS technology; Decorrelation; Linear predictive coding; Linear regression; MOS devices; MOSFET circuits; Measurement standards; Research and development; Threshold voltage; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
Type :
conf
DOI :
10.1109/ESSDERC.2000.194845
Filename :
1503775
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1920237
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