Title :
Low Frequency Noise in CdSe Thin-Film Transistors
Author :
Deen, M. Jamal ; Rumyantsev, S.L. ; Landheer, D. ; Xu, D.X.
Author_Institution :
McMaster University, Hamilton, Ontario, Canada
fDate :
11-13 September 2000
Keywords :
Active matrix liquid crystal displays; Amorphous silicon; Low-frequency noise; Noise measurement; Plasma temperature; Resistors; Semiconductor device noise; Temperature distribution; Thin film transistors; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194847
